Integrated circuit test equipment

IC test equipment and other EMC instruments, also divided into interference and anti-interference two parts of the instrument. In addition for integrated circuits IC there are emerging test methods are IC safety test equipment, IC edge channel analysis equipment in these two areas, details click on the product categories below or product links for more information.

The current instrument classification contains the following subcategories:

The current Instruments category and its subcategories contain the following test equipment and products:

Total number of Test Instruments products currently on sale in the Equipment category: 49; Total number of products on current page: 8.
ICI-DP HH150-15 set Dual Pulse Fault Injection Kit

ICI-DP HH150-15 set Dual Pulse Fault Injection Kit

ICI-DP HH150-15 set is a double-pulse fault injection set manufactured by Langer EMV-Technik, Germany, and authorized to be sold and quoted by EUTTEST in Shenzhen, China....View this product

ICI E450 L-EFT set Pulsed Electric Field Injection Test System for Integrated Circuits

ICI E450 L-EFT set Pulsed Electric Field Injection Test System for Integrated Circuits

ICI E450 L-EFT set is a pulsed electric field injection test system developed by German langer company, which is represented by Shenzhen EUTTEST for sales and after-sales service. The system consists of a model ICI...View this product

ICI E450 L-EFT Electric Field Injection Probe for Integrated Circuits

ICI E450 L-EFT Electric Field Injection Probe for Integrated Circuits

The ICI E450 L-EFT is an electric field injection probe manufactured by langer in Germany. The 450μm probe size allows engineers to inject or couple fast transient pulses onto the surface or pins of the IC under test, which...View this product

ICI I900 L-EFT Langer Injection Pulse to Chip Probe

ICI I900 L-EFT Langer Injection Pulse to Chip Probe

ICI I900 L-EFT is a pulse signal injection probe manufactured by Langer EMV, generally used for bias injection or coupling to the IC chip under test, the tip of the probe adopts a spring design, which is convenient for test workers....View this product

ICI I900 L-EFT set Integrated Circuit Injection Pulse Jitter Interference Test System

ICI I900 L-EFT set Integrated Circuit Injection Pulse Jitter Interference Test System

The ICI I900 L-EFT set is a pulse jitter test system produced by Langer - EMV, Germany, dedicated to injecting disturbances into the pins or surfaces of integrated circuits, the system is mainly...View this product

ICI HH500-15L-EFT set Integrated Circuit Pulsed Magnetic Field Fault Injection Experiment Set

ICI HH500-15L-EFT set Integrated Circuit Pulsed Magnetic Field Fault Injection Experiment Set

ICI HH500-15L-EFT set is a pulsed magnetic field fault injection test set produced by langer emv, Germany, which is specially designed for IC chip injection interference testing. Inside the set are...View this product

ICI HH500-15L-EFT Pulsed Magnetic Field Injection Probe 500μm Resolution

ICI HH500-15L-EFT Pulsed Magnetic Field Injection Probe 500μm Resolution

The ICI HH500-15L-EFT is a pulsed magnetic field injection probe from Langer, Germany, which is an accessory in the ICI HH500-15L-EFT set. ICI...View this product

ICI-DP HH500-15 Integrated Circuit Double Pulse Fault Injection Magnetic Field Probe 500μm probe diameter

ICI-DP HH500-15 Integrated Circuit Double Pulse Fault Injection Magnetic Field Probe 500μm probe diameter

ICI-DP HH500-15 is an IC double-pulse fault injection magnetic field probe manufactured by Langer-EMV, Germany, with a tip diameter of 500 μm and a double-pulse magnetic field source, ICI-D...View this product