Integrated circuit test equipment

IC test equipment and other EMC instruments, also divided into interference and anti-interference two parts of the instrument. In addition for integrated circuits IC there are emerging test methods are IC safety test equipment, IC edge channel analysis equipment in these two areas, details click on the product categories below or product links for more information.

The current instrument classification contains the following subcategories:

The current Instruments category and its subcategories contain the following test equipment and products:

Total number of Test Instruments products currently on sale in the Equipment category: 49; Total number of products on current page: 8.
P603-1 Langer-EMV 1Ω High Frequency Current Probe Conforms to IEC 61947-4 

P603-1 Langer-EMV 1Ω High Frequency Current Probe Conforms to IEC 61947-4 

P603-1 is a 1Ω high frequency current probe manufactured by Langer-EMV and distributed by EUTTEST, available from 0.2kHz to 3GHz, P603-1 complies with IEC ...View this product

P603 Langer 1Ω High Frequency Current Probe Conforms to IEC 61947-4 

P603 Langer 1Ω High Frequency Current Probe Conforms to IEC 61947-4 

The P603 is a 1Ω high frequency current probe manufactured by langer-emv and distributed by EUTTEST, available for frequencies from 9kHz to 3GHz, the P603 meets the requirements of IEC 61947-4....View this product

P602 Langer 0.1Ω High Frequency Current Probe Conforms to IEC 61947-4 

P602 Langer 0.1Ω High Frequency Current Probe Conforms to IEC 61947-4 

P602 is a 0.1Ω high-frequency current probe manufactured by langer-emv in Germany and distributed by EUTTEST. P602 is a 0.1Ω probe for direct measurement of high-frequency currents on integrated circuit pins....View this product

EPM02 Langer-EMV Electric Field Probe Option

EPM02 Langer-EMV Electric Field Probe Option

EPM02 is an IC integrated circuit electric field probe manufactured by Langer EMV, Germany and distributed by EUTTTEST. EMP02 is an option that can be used with P1601, P1602, P1...View this product

CS-ESA set and ChipScan-ESA Integrated Circuit IC Test System Software

CS-ESA set and ChipScan-ESA Integrated Circuit IC Test System Software

CS-ESA set is a software package for EMI testing of IC integrated circuits installed on the computer, after the installation of the software named: ChipScan-ESA, IC IC scanning software ChipS...View this product

BPM02 Langer EMV Magnetic Field Probe Option

BPM02 Langer EMV Magnetic Field Probe Option

BPM02 is an IC integrated circuit magnetic field probe manufactured by langer-emv in Germany and distributed by EUTTTEST. BMP02 is an option that can be used with P1601, P1602, P1702...View this product

FLS 106 IC set 4-axis displacement scanning positional test system for integrated circuits

FLS 106 IC set 4-axis displacement scanning positional test system for integrated circuits

FLS 106 IC set is a 4-axis displacement scanning and positioning test system produced by German langer company, which is sold by Shenzhen EUTTEST agent.FLS 106 IC set system contains a...View this product

ICS 105 set 4-axis IC integrated chip Near-field radiation scanner

ICS 105 set 4-axis IC integrated chip Near-field radiation scanner

The ICS 105 set is an IC scanner test system produced by Langer - EMV in Germany and distributed by EUTTEST in Shenzhen, China. The ICS 105 set included in the system can be used for small...View this product