Introduction：
The XF1 SET series of near-field probes are high-resolution near-field probes manufactured by Langer-emv in Germany and distributed by EUTTEST. The XF1 SET consists of four passive magnetic field probes and three passive electric field probes.
Uses:
The XF1 SET is used for electric and magnetic field measurements in the R&D phase of electronic modules and covers the frequency range from 30 MHz to 6 GHz. the probe has a built-in impedance matcher, making it less sensitive in the low frequency region than other probes, such as RF type probes. The wide range of test frequencies and the inclusion of a variety of probes from very large to very small sizes allow for a wide range of applications. The XF1 probes are assembled exactly to the customer's needs. The probes of the XF series can be used to step-by-step find the source of interference fields in a module. We recommend that the large, highly sensitive probes are first used to locate the source of the module's interfering radiation from a distance, and then the higher resolution probes are used to further pinpoint the source of the interference. By operating the near-field probe accordingly, the direction of the electromagnetic field and its distribution can be measured. This near-field probe is compact and lightweight and utilizes skin current attenuation. The magnetic field probe is electrically shielded and the XF1 SET near-field probe can be connected to the 50Ω input of a spectrum analyzer or oscilloscope. These near-field probes are internally mounted with terminating resistors.
- 6GHz high resolution:MFA01 SET Langer-EMV High Resolution Near Field Probe 1MHz-6GHz
- 20GHz Near Field Probes are now available, please see linked products:SX1 SET LANGER-EMV Passive Near Field Probe 1GHz-10(20)GHz
- 40GHz Near Field Probes are now available, please see linked products:HR-E 40-1 set langer-emv magnetic near-field probe 40GHz
Main technical parameters:
Frequency range: 30MHz - 6GHz
Interface: SMB, male, jack
Packing list.
The following probes are included with the XF1 SET and can be purchased in any combination, Ø is the approximate resolution that can be tested:
- 1x XF-B 3-1, magnetic field probe (30MHz-6Hz)
- 1x XF-E 10, electric field probe (30MHz-6GHz)
- 1x XF-R 3-1, magnetic field probe (30MHz-6GHz)
- 1x XF-R 400-1, magnetic field probe (30MHz-6Hz)
- 1x XF-U 2.5-1, magnetic field probe (30MHz-6GHz)
- 1x SMA-SMA 1 m, SMA-SMA measuring cable
- 1x XF 1 qg, XF1 SET Series Quick Guide
- 1x Case 5
Other optional single probes
<<<<提醒：左右滑动表格>>>> XF-R 400-1 | XF-R 400-1 Magnetic field probe (30MHz-6GHz) Ø ≈ 25 mm |
 XFS-R 100-1 | XFS-R 100-1 Magnetic field probes (30MHz-6GHz) Ø ≈ (10×10) mm, resolution 10mm |
 XF-R 3-1 | XF-R 3-1 Magnetic field probes (30MHz-6GHz) Ø ≈ 3 mm, resolution 1 mm |
 XF-B 3-1 | XF-B 3-1 Magnetic field probes (30MHz-6GHz) Ø ≈ 4mm, resolution 2mm |
 XF-U 2.5-1 | XF-U 2.5-1 Magnetic field probes (30MHz-6GHz) Ø ≈ 4mm, resolution 0.5mm |
 XF-E 09s | XF-E 09s Electric field probes (30MHz-6GHz) Ø ≈10*10mm |
 XF-E 04s | XF-E 04s Electric field probes (30MHz-6GHz) Ø ≈5*5mm |
 XF-E 10 | XF-E 10 Electric field probes (30MHz-6GHz) Ø ≈0.5*2mm Resolution = 0.2mm |
Test Methods
Near-field probes need to be used with a spectrometer or receiver
XF1 set with Spectrometer Test Configuration Chart
Frequency characteristic curves and insertion loss for each probe can be requested by contacting EUTTEST.
Use a low-resolution probe to find the approximate location of the interference, then a high-resolution probe to find the specific component location.
