Shenzhen EUTTEST Technology Co., Ltd

IEC 61967-2 Integrated circuit EMC test equipmentIEC 61967-2 integrated circuit EMC test equipment

IEC 61067-2定义了测量集成电路(IC)电磁辐射的方法。被评估的IC安装在IC测试印刷电路板(PCB)上,该PCB被夹持到在横向电磁(TEM)或宽带千兆赫TEM(GTEM)室的顶部或底部切割的配合端口(称为壁端口)。测试板不像传统的使用方法那样位于TEM CELL内部,而是成为TEM CELL壁的一部分。

FCC-TEM-JM7D

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