IEC 62132-8：2012规定了一种测量集成电路（IC）对150 kHz至3 GHz频率范围内射频（RF）辐射电磁干扰的抗扰度的方法。
标准名称：
IEC 62132-8:2012 Integrated circuits – Measurement of electromagnetic immunity – Part 8: Measurement of radiated immunity – IC stripline method
EC 62132-8：2012 集成电路电磁抗扰度测量第8部分：辐射抗扰度测量IC带状线法
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