FCC-TEM-JM5 is composed of the United States FCC (Fischer Custom Communications, Inc. ) Produced and authorized by Shenzhen EUTTEST to sell TEM Yokoyama Komuro as an agent.
FCC-TEM-JM5 can be used for EMI-RE radiation emission and EMS-RS radiation immunity testing on DC-3000MHz small PCB or integrated circuit chips. Its patented diaphragm design provides broadband response, excellent field uniformity, low VSWR and low insertion loss. According to SAE 1752/3, the FCC-TEM-JM5 and FCC-TEM-JM2 models are ideal for radiation emission testing of semiconductor devices. The JM series TEM cell can be used for immunity testing. It only requires an input power of 3.7 mW to reach an electric field of 10 V/m, and an input power of 37 W can reach an electric field of 1000 V/M.
EUTTEST also provides a full range of current probe products from the US FCC. For details, click the link below for more information.
US FCC current probe/injection probe/calibration fixture
Technical parameters of FCC-TEM-JM5：
| Available frequency | DC-3000MHz |
| External size | 15*10*34cm |
| Maximum measurable EUT size | 6*6*1 cm |
| Maximum input power | 500W |
| connector | N |
| VSWR | 1.2：1 |
| Meet the standard | SAE 1752/3 |
More optional TEM models：
FCC-TEM-JM1 horizontal electromagnetic wave TEM chamber DC-1200MHz
FCC-TEM-JM2 horizontal electromagnetic wave TEM chamber DC-1600MHz
FCC-TEM-JM3 horizontal electromagnetic wave TEM chamber DC-2000MHz
FCC-TEM-JM4 horizontal electromagnetic wave TEM chamber DC-2500MHz
FCC-TEM-JM5 horizontal electromagnetic wave TEM chamber DC-3000MHz
FCC-TEM-JM7D horizontal electromagnetic wave TEM chamber 10kHz-3GHz
EM601-6 horizontal electromagnetic wave TEM chamber DC-6GHz
- Applicable standards for this instrument：IEC 61967-2 test instrument；IEC 62132-8 test instrument；SAE J1752/3 test equipment
- This instrument is suitable for industry：Integrated circuit semiconductor chips and devices
- Test classification of this device：Radiation emission test equipment, Radiation immunity test equipment