Product Description:
The P1302-4 is one of the Pulse Swarm Electric Field Probes manufactured by Langer EMV-Technik, Germany. the EFT/Burst Electric Field Source Probe can be used to determine the immunity of an IC to pulsed coupling of an EFT field. the P1302-4 is compatible with the P1202-4The test connections, measured output voltages, etc. are the same, but the P1302 uses coupling of the pulse group generator output signal to the IC chip under test by means of electric field coupling.
P1302-4 Coupling of pulse group signals to the chip surface by means of electric field coupling
How it works:
P1302-4 Test Schematic
The voltage applied to the HV input of the probe reaches the top electrode of the P1302-4, which exists between the electrode and the GND plane and generates an electric field depending on the distance h (shim), which is proportional to the burst voltage.
The electric field lines terminate at the metal parts of the IC Apad (pad pins, bond wires, chips) and they conduct displacement currents to these surfaces.
The strength of the electric field generated by the P1302-4 probe and the anti-interference effect depend on the following parameters
- Level setting of pulse group voltage
- Distance to probe coupling electrode
- Surface Area of IC Pad
Product technical parameters:
<<<<提醒：左右滑动表格>>>>| Probe Model | P1302-4 |
| manufacturer | Langer EMV-Technik |
| agent | Shenzhen EUT TEST |
| Pulse Properties - Shape | 5/50ns |
| Pulse Voltage | Maximum ±8kV |
| Internal Voltage Probe | Coupling factor: 60dB Test Output Port: 50 Ohm, SMB Shunt: 0.1 ohm |
| Pulse Input Connector | 50 Ω Fischer (D103A023) |
| size | 180*96*96mm |
| Optional Kit | P1202-4 / P1302-4 set Electric transient field coupling source group |
