Product Description:
The P603 / P750 set from Langer EMV-Technik is a set of analytical probes for RF conduction measurements of integrated circuits. The set contains two different probes, the P603 (1Ω current probe) and the P750 (150Ω voltage probe), and is supplied with the standard CS-ESA conduction test software.
This probe set is authorized to be sold and quoted for service by EUTTEST Shenzhen.
Test function description:
This probe set is used to measure conducted emissions at IC pins (directly measuring conducted emission signals with 1 ohm/150 ohm coupled chip pins) and is configured with two probes for current and voltage measurements respectively. The probes can reach and touch each test IC pin.
The ICE1 set integrated circuit EMC test environment with Langer EMV-Technik can be used to remotely start up the test IC on the host computer side, as well as to perform measurements using the ChipScan-ESA software. Measurement results for all pins under test are saved in the software and can be compared quickly and systematically.
The P603 / P750 set includes a list of accessories:
Click on the product model number in the list below for detailed parameters of the accessories in the set.
<<<<提醒：左右滑动表格>>>> | Set Model | P603 / P750 set |
| branding | Langer Electronics Langer EMV-Technik |
| agent | EUTTEST |
| Standard configuration list | - 1x P603 RF Current Probe 1 Ohm
- 1x P750 RF Voltage Detector 150 Ohm
- 1x CS-ESAChipScan-ESA software/USB
- 1x SMA-SMB 1 m, SMA-SMB measuring cable
- 1x P603 / P750 Chassis, System Chassis
- 1x P603/P750 m, P603/P750 Set Instructions for use (English version)
- 1x P603/P750 m-cn, P603/P750 Set Instructions for use (Chinese version)
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ICE1 set Integrated Circuit Test Environment
Service
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