IC Industry

The instrumentation and equipment listed on this page can be used in the integrated circuit industry to test EMC or safety regulations. Integrated circuits, also known as chips or semiconductor devices, are used only as a component, but they still need to be tested as rigorously as a complete product.

The current Instruments category and its subcategories contain the following test equipment and products:

Total number of Test Instruments products currently on sale in the Equipment category: 45; Total number of products on current page: 8.
IC-TEST-SOCKET Customized Development of IC Test Fixture for Digital Isolator

IC-TEST-SOCKET Customized Development of IC Test Fixture for Digital Isolator

IC-TEST-SOCKET Digital Isolator for IC Test Fixture Custom Development is an exclusive product offered by EUTTEST using the HT9464 or HT9464M test master provided by EUTTEST...View this product

BS 06DU-s High Resolution Pulse Swarm Field Source Probe

BS 06DU-s High Resolution Pulse Swarm Field Source Probe

The BS 06DU-s is a high-resolution pulse swarm field source from Langer EMV, Germany. The BS 06DU-s, like the BS 06DB-s, can be used with the EFT pulse swarm transmitter...View this product

P1302-4 Pulsed Group Electric Field Probe

P1302-4 Pulsed Group Electric Field Probe

The P1302-4 is one of the Pulse Swarm Electric Field Probes manufactured by Langer EMV-Technik, Germany. The EFT/Burst Electric Field Source Probe can be used to determine the IC coupling of EFT field pulses to...View this product

P1202-4 50R Pulsed Group Magnetic Field Probe

P1202-4 50R Pulsed Group Magnetic Field Probe

The P1202-4 50R is a 50 ohm pulse group magnetic field probe manufactured by Langer EMV GMBH, Germany. The P1202-4 50R probe has the same rotational characteristics as the P1202-4...View this product

P1202-4 Pulsed Group Magnetic Field Probe

P1202-4 Pulsed Group Magnetic Field Probe

P1202-4 is a pulsed swarm magnetic field probe product manufactured by Langer EMV GMBH, Germany. The EFT/burst magnetic field source probe can be used to determine the immunity performance of integrated circuit ICs to pulsed electromagnetic field coupling....View this product

P1202-4 / P1302-4 set Electrical Transient Field Coupled Field Source Set

P1202-4 / P1302-4 set Electrical Transient Field Coupled Field Source Set

The P1202-4 / P1302-4 set is an electrically transient field coupled field source group probe set manufactured by Langer EMV-Technik, Germany. The set contains the magnetic field injection probe P120...View this product

P250 set Integrated Circuit Pulse Swarm Injection Probe Set

P250 set Integrated Circuit Pulse Swarm Injection Probe Set

The P250 set is an IC swarm injection probe set from Langer EMV, Germany, designed for EMC-swarm injection testing of integrated circuits according to IEC 62215-...View this product

P302 L-EFT 500V Pulse Group Voltage Generator

P302 L-EFT 500V Pulse Group Voltage Generator

The P302 L-EFT is a 500V pulse train current generator manufactured by Langer EMV, Germany, which can be used as a rectification tool for pulse train testing of integrated circuit pins.The P302 can be used by electric field...View this product