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Integrated circuit test equipment

IC test equipment and other EMC instruments, also divided into interference and anti-interference two parts of the instrument. In addition for integrated circuits IC there are emerging test methods are IC safety test equipment, IC edge channel analysis equipment in these two areas, details click on the product categories below or product links for more information.

Integrated circuit test equipment

The current instrument classification contains the following subcategories:

The current Instruments category and its subcategories contain the following test equipment and products:

Total number of Test Instruments products currently on sale in the Equipment category: 49; Total number of products on current page: 8.
P202 L-EFT 40V Pulse Group Current Generator

P202 L-EFT 40V Pulse Group Current Generator

The P202 L-EFT is a 40V pulse train current generator manufactured by Langer EMV, Germany, and is a pulse train test rectification tool.The P202 couples pulse currents to the wires of an integrated circuit chip...View this product

P202 / P302 L-EFT set Integrated Circuit EMP Injection Probe Set

P202 / P302 L-EFT set Integrated Circuit EMP Injection Probe Set

The P202 / P302 L-EFT set is an integrated circuit EMP injection probe set from Langer EMV-Technik, Germany, which contains the P202 ...View this product

P1602 / P1702 set Integrated Circuit RF Emission Test Set - Test Frequency 3GHz

P1602 / P1702 set Integrated Circuit RF Emission Test Set - Test Frequency 3GHz

The P1602 / P1702 set is a set of RF radiation test probes manufactured by Langer EMV-Technik, Germany. The set contains the P1601 / P1702 s...View this product

P1601 / P1702 set Integrated Circuit RF Emission Test Kit - Test Frequency 1GHz

P1601 / P1702 set Integrated Circuit RF Emission Test Kit - Test Frequency 1GHz

The P1601 / P1702 set is a set of RF radiation test probes manufactured by Langer EMV-Technik, Germany. The set contains two test probes for integrated circuits that emit...View this product

P603-1 / P750 set Integrated Circuit Conducted Emission Measurement Probe

P603-1 / P750 set Integrated Circuit Conducted Emission Measurement Probe

The P603-1 / P750 set, manufactured by Langer EMV-Technik, Germany, is designed for testing integrated circuits and functional chips in accordance with the IEC 61967-4 standard for conduction....View this product

S603 / S750 set Conducted RF Test Probe Set to IEC 61967-4

S603 / S750 set Conducted RF Test Probe Set to IEC 61967-4

The S603 / S750 set is a conducted RF test probe set according to IEC 61967-4 manufactured by Langer EMV-Technik, Germany. The set contains the SMA connector for...View this product

ICE1 set Integrated Circuit EMC Test Environment

ICE1 set Integrated Circuit EMC Test Environment

ICE1 set is produced by the German Langer EMV-Technik company specializing in IC-EMC testing of integrated circuits EMC test environment set, the product by the Shenzhen EUTTEST agent ...View this product

P603 / P750 set Integrated Circuit RF Conductivity Measurement and Analysis Probe

P603 / P750 set Integrated Circuit RF Conductivity Measurement and Analysis Probe

The P603 / P750 set is a set of analytical probes for RF conduction measurements of integrated circuits manufactured by Langer EMV-Technik, Germany, which contains the P603 (1Ω...View this product

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