Product Description:
The DPA 500N1.1 is a 16A harmonic and scintillation test analyzer manufactured by EMTEST Switzerland and distributed by EUTTEST Shenzhen. The DPA 500N1.1 is a harmonic and scintillation analyzer fully compliant with the latest IEC/EN 61000-3-2, IEC/EN 61000-3-3 and JIS C 61000-3-2 requirements. It follows the design specifications of IEC/EN 61000-4-7 (for Class I instruments) and IEC/EN 61000-4-15. It is based on a real-time kernel with its own hard disk and records measurements continuously without any gaps or overlaps. The rectangular measurement window is synchronized to the supply frequency (50 Hz or 60 Hz) for 10 or 12 cycles per set by means of a digital phase-locked loop (PLL). The wide-range current input avoids loss of measurement data due to range switching when using different shunt resistors.
DPA500N1.1 Product Features:
- Real-time data acquisition
- Internal hard disk for data storage
- 16-bit A/D Converter
- Wide range current (26 A) and voltage inputs
- Includes 0 - 500 mA current measurement range
- Built-in stacked flicker impedance up to 26 Arms
- Advanced analytics and reporting capabilities
- USB interface for control and data transfer
Technical parameters:
Product Specification Sheet:
“Reminder: swipe tables left and right”10 - 530 Vrms (4 kV peak), 16-bit, 15 - 3000 Hz
Accuracy: ± 0.04 % range ± 0.30 % reading
Current measurement CM: 0 - 26 amps continuous
Very Low Current Measurement VLCM: 0 - 500 mA
Accuracy: ± 0.1 % of range ± 0.70 % of reading ± 0.08 % (frequency / 1000)
pertain IEC 61000-3-2 Ed 2.1,
IEC 61000-3-12 (with external current transformer),
JIS 61000-3-2 and related standards version 2.1
Line 0.24 Ω + j0.15 Ω, Neutral 0.16 Ω + j0.10 Ω
ACS 500N6 - 6 kVA single phase AC voltage source;
NetWave 3.1 - 3 kVA single phase AC/DC voltage source;
NetWave 7 / 7.3 - 7 kVA single phase AC/DC voltage source;
Please purchase EUTTEST's products.DPA 503N & AIF 503N
Harmonic scintillation analyzer metrology equipment HFG01KIT01
Test software Compliance Test Studio 23 (CTS 23):

DPA 500N1.1 Test Software Compliance Test Studio 23 (CTS 23)
The EMTEST Compliance Test Studio 23 (CTS 23) is the software tool required to operate a harmonic and scintillation analysis system. It has all the functions for controlling DPA 503N and AIF 503N, uploading recorded measurement data, and classifying and analyzing them. It includes analyses according to the latest standards, as well as procedures that follow the requirements of previous standards. Simple fault/passage functions enable quick analysis, while detailed data can be used for extended analysis and EUT evaluation.The CTS 23 has a powerful documentation function with direct export to Word, PDF and other file formats.
EMTEST CTS 23 Software Testing Functions:
“Reminder: swipe tables left and right”IEC 61000-3-12 Revisions 1, 2 and 2.1
JIS C 61000-3-2 2005 and 2019 editions
EN 12015 2014
IEC 61000-3-16 1st Edition
ECE R10 5th and 6th editions
Ecodesign LED (CELEX 2019/2020)
Various manufacturer standards
IEC 61000-3-11 1st and 2nd editions
DIN EN 61000-3-3 euttest
ECE R10 5th and 6th editions
Various manufacturer standards
Shenzhen EUTTEST Technology Co., Ltd. is the designated sales unit of EMTEST, agent sales of Swiss EMTEST all serial products, consulting EMTEST product offerings, please contact EUTTEST sales staff.
DPA500N1.1 Harmonic Test Evaluation Process:
- Check the test data of each test window and use the mouse to switch the test data of any point.
- Forward and reverse display of the test process
- Display of harmonic currents and voltages at each point in the time and frequency domains
- Print a table of harmonic currents and voltages at each point
- Prints graphs of harmonic currents and voltages in the time and frequency domains for each point.
- On the time axis, the magnitude of each harmonic component is displayed
- Three-phase harmonic analysis, test data of all phases are saved in the same file and can be switched to display at will.
- Checking long-cycle test data (150s per test window)
- Possibility to change the classification of the device under test after the test
- AC source can output sufficient inrush current
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