Product Description:
The P1302-4 50R is one of the Pulse Group Electric Field Probes manufactured by Langer EMV-Technik, Germany. the EFT/Burst Electric Field Source Probe can be used to determine the immunity of an IC to EFT field pulse coupling. the P1302-4 50R is compatible with the P1202-4 50R The test connections, measured output voltage, and principle of operation are the same, but the former uses a 50 ohm termination resistor.
P1302-4 50R Test Schematic
The relevant abbreviations in the above chart are explained below:
- Up: voltage between probe coupling electrode and IC coupling surface area
- Uvg: pulse group generator output voltage
- Rg: Pulse group generator internal resistance
- Rp: internal probe termination resistance
- E: electric field strength between probe coupling electrode and IC coupling surface area
- Apad: coupling surface area of IC
- Rpad: pad resistance
- h: gap between coupling electrode and IC pads
Product technical parameters:
<<<<提醒：左右滑动表格>>>>| Probe Model | P1302-4 50R |
| manufacturer | Langer EMV-Technik |
| agent | Shenzhen EUT TEST |
| input resistance | 50 ohms |
| Pulse Properties - Shape | 5/50ns |
| Pulse Voltage | Maximum ±8kV |
| Internal Voltage Probe | Coupling factor: 60dB Test Output Port: 50 Ohm, SMB |
| Pulse Input Connector | 50 Ω Fischer (D103A023) |
| size | 180*96*96mm |
| Optional Kit | P1202-4 / P1302-4 set Electric transient field coupling source group |
P1302-4 50R Measured input voltage
