Introduction:
China in 2025 released a number of IC EMC integrated circuit EMC national standards, covering EMI - chip itself issued by the EMC interference, as well as EMS - the ability to withstand external EMC interference of the two parts of the standard content, the standard number were set as GB/T 44937 sequence and GB/T 42968 sequence of the two parts of the standard, most of the content in accordance with the IEC standard customized to use, of course, also put forward a new Faraday cage method and BCI test method, which for China's integrated circuit EMC test technology to provide a truly own standard system. Of course, the new Faraday cage method and BCI test method are also proposed, which provides a real own standard system for China's IC EMC test technology.
Since most of the GB/T 44937 Sequence and GB/T 42968 Sequence standards have not yet been formally activated, there is no publicly available information on the standards. After most of the standards are made publicly available on July 1, 2026, EUTTEST will keep updating the brief test methods of the relevant standards according to the following standards catalog and list.
“Reminder: swipe tables left and right” “Reminder: swipe tables left and right” In addition, we have included at the end a list of military IC test standards, SJ 21147 and SJ 21473, as well as a list of IC-EMC standards, YD/T 1690, required for internal ICs in telecommunication equipment. Now, you can view the list of all domestic applicable ICEMC EMC test standards on this page, the standard is only a description of the requirements of a test method document, the specific choice of which standard depends on your product type, the following list of standards and names for your reference and comparison.
IC EMC List of national standards for integrated circuit electromagnetic compatibility:
GB/T 44937 Serial Integrated Circuit EMC EMI Test Standard:
“Reminder: swipe tables left and right” name (of a thing)
English name
Release Date
Implementation date
Citation of English standards
acronyms
typology
Electromagnetic Emission Measurements on Integrated Circuits Part 1: General Conditions and Definitions
Integrated circuits-Measurement of electromagnetic emissions-Part 1: General conditions and definitions
2025-12-31
2026-07-01
ICEMC-EMI-Generic Terminology Section
EMI
Integrated Circuits Electromagnetic Emission Measurements Part 2: Radiated Emission Measurements TEM Chamber and Broadband TEM Chamber Methods
Integrated circuits - Measurement of electromagnetic emissions - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell methods TEM cell and wideband TEM cell method
2025-12-31
2026-07-01
ICEMC-EMI-TEM method
EMI
Integrated Circuits Electromagnetic Emission Measurements Part 3: Radiated Emission Measurements Surface Scan Method
Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method Surface scan method
2025-12-31
2026-07-01
IEC TS 61967-3:2014
ICEMC-EMI-Surface Scan Method
EMI
Integrated Circuits Electromagnetic Emission Measurements Part 4: Conducted Emission Measurements 1Ω/150Ω Direct Coupling Method
Integrated circuits-Measurement of electromagnetic emissions-Part 4: Measurement of conducted emissions -1Ω/150Ω direct coupling method
2024-12-31
2024-12-31
IEC 61967-4:2021
ICEMC-EMI-1Ω/150Ω direct coupling method
EMI
Integrated Circuit Electromagnetic Emission Measurements Part 5: Conducted Emission Measurements Bench Faraday Cage Method
Integrated circuits-Measurement of electromagnetic emissions-Part 5: Measurement of conducted emissions -Workbench Faraday Cage method
2025-12-31
2026-07-01
not have
ICEMC-EMI-Faraday cage method
EMI
Integrated Circuits Electromagnetic Emission Measurements Part 6: Conducted Emission Measurements Magnetic Field Probe Method
Integrated circuits-Measurement of electromagnetic emissions-Part 6: Measurement of conducted emissions -Magnetic probe method
2025-12-31
2026-07-01
IEC 61967-6:2008
ICEMC-EMI-Magnetic field probe method
EMI
Integrated Circuits Electromagnetic Emission Measurements Part 8: Radiated Emission Measurements IC Strip Line Method
Integrated circuits-Measurement of electromagnetic emissions-Part 8: Measurement of radiated emissions- IC stripline method IC stripline method
2025-12-31
2026-07-01
IEC 61967-8:2023
ICEMC-EMI-IC strip line method
EMI
“Reminder: swipe tables left and right” GB/T 42968 EMC EMS test standard for serial integrated circuits:
“Reminder: swipe tables left and right” name (of a thing)
English name
Release Date
Implementation date
Citation of English standards
acronyms
typology
Electromagnetic Immunity Measurement of Integrated Circuits Part 1: General Conditions and Definitions
Integrated circuits-Measurement of electromagnetic immunity-Part 1: General conditions and definitions
2023-09-07
2024-01-01
IEC 62132-1:2015
ICEMC-EMS-Generic Terminology Section
EMS
Integrated Circuit Electromagnetic Immunity Measurements Part 2: Radiated Immunity Measurements TEM Chamber and Broadband TEM Chamber Methods
Integrated circuits-Measurement of electromagnetic immunity-Part 2: Measurement of radiated immunity- TEM cell and wideband TEM cell method
2024-10-26
2024-10-26
IEC 62132-2:2010
ICEMC-EMS-TEM method
EMS
Integrated Circuit Electromagnetic Immunity Measurements Part 3: High Current Injection (BCI) Method
Integrated circuits-Measurement of electromagnetic immunity-Part 3: Bulk current injection (BCI) method
2025-12-02
2025-12-02
not have
ICEMC-EMS-BCI method
EMS
Integrated Circuit Electromagnetic Immunity Measurements Part 4: RF Power Direct Injection Methods
Integrated circuits-Measurement of electromagnetic immunity-Part 4: Direct RF power injection method
2024-12-31
2024-12-31
IEC 62132-4:2006
ICEMC-EMS-DPI method
EMS
Integrated Circuit Electromagnetic Immunity Measurements Part 5: Bench Faraday Cage Methods
Integrated circuits-Measurement of electromagnetic immunity-Part 5: Workbench Faraday cage method
2025-12-02
2025-12-02
not have
ICEMC-EMS-Faraday cage method
EMS
Integrated Circuit Electromagnetic Immunity Measurements Part 8: Radiated Immunity Measurements IC Strip Line Method
Integrated circuits-Measurement of electromagnetic immunity-Part 8: Measurement of radiated immunity-IC stripline method
2023-09-07
2024-01-01
IEC 62132-8:2012
ICEMC-EMS-IC strip line method
EMS
Integrated Circuit Electromagnetic Immunity Measurements Part 9: Radiated Immunity Measurements Surface Scan Method
Integrated circuits-Measurement of electromagnetic immunity-Part 9: Measurement of radiated immunity- Surface scan method
2025-12-02
2025-12-02
IEC TS 62132-9:2014
surface scanning method
EMS
“Reminder: swipe tables left and right” List of EMC test standards for electromagnetic emissions and electromagnetic immunity of military integrated circuits:
Military integrated circuits are divided into SJ 21147 sequence and SJ 21473 sequence of two standard content, compared with the national standard less test items, but later will certainly be unified to increase all test items.

Military Integrated Circuits SJ 21147 Sequence and SJ 21473 Sequence IC EMC National Standard for Electromagnetic Compatibility of Integrated Circuits
“Reminder: swipe tables left and right” Corresponding to IEC standards
Standard name
IEC 61967-1: 2002
Electromagnetic Emission Measurement Methods for Military Integrated Circuits Part 1: General Conditions and Definitions
IEC 61967-2: 2005
Electromagnetic Emission Measurement Methods for Military Integrated Circuits Part 2: Radiated Emission Measurements-TEM Chamber and Broadband TEM Chamber Methods
IEC 61967-3: 2005
Electromagnetic Emission Measurement Methods for Military Integrated Circuits Part 3: Radiated Emission Measurements-Surface Scanning Methods
IEC 61967-4: 2006
Methods of Measurement of Electroemission from Military Integrated Circuits Part 4: Conducted Emission Measurements - 1Ω 150Ω Direct Coupling Method
IEC 61967-5: 2003
Electromagnetic Emission Measurement Methods for Military Integrated Circuits Part 5: Conducted Emission Measurement - Bench Faraday Cage Method
iec 62132-2: 2010
Electromagnetic Immunity Measurement Methods for Military Integrated Circuits Part 2: Radiated Immunity Measurements-TEM Chamber and Broadband TEM Chamber Methods
IEC 62132-3: 2007
Electromagnetic Immunity Measurement Methods for Military Integrated Circuits Part 3 Conducted Immunity Measurements High current injection (BCI) method
IEC 62132-4: 2006
Electromagnetic Immunity Measurement Methods for Military Integrated Circuits Part 4 Conducted Immunity Measurement I RF Power Direct Injection Method
not have
Electromagnetic Immunity Measurement Methods for Military Integrated Circuits Part 5 Conducted Immunity Measurements I Bench Faraday cage method
“Reminder: swipe tables left and right” YD/T 1690 List of EMC test standards for diagnostic techniques for electromagnetic emissions from integrated circuits inside serial telecommunications equipment:

YD/T 1690 List of EMC test standards for integrated circuits inside serial telecommunication equipment
“Reminder: swipe tables left and right” Corresponding to IEC standards
Standard name
iec 61967-1 2002-03
Technical Requirements and Measurement Methods for Diagnosis of Electromagnetic Emissions within Telecommunications Equipment (150kHz-1GHz) Part 1 - General Conditions and Definitions
iec 61967-2-2005-09
Technical Requirements and Measurement Methods for Diagnosis of Electromagnetic Emissions Inside Telecommunications Equipment (150kHz-1GHz) Part 2-Radiated Emission Measurements TEM Cell and Broadband TEM Cell Methods
iec 61967-3-2005-06
Technical Requirements and Measurement Methods for Diagnosis of Electromagnetic Emissions Inside Telecommunication Equipment (150kHz-1GHz) Part 3-Radiated Emission Measurements Exterior Scanning Methods
iec 61967-4-2002-04
Technical Requirements and Measurement Methods for Diagnosis of Electromagnetic Emissions within Telecommunications Equipment (150kHz-1GHz) Part 4 - Conducted Emission Measurements 1Ω-150Ω Direct Coupling Methods
iec 61967-5-2003-02
Technical Requirements and Measurement Methods for Diagnosis of Electromagnetic Emissions within Telecommunications Equipment (150kHz-1GHz) Part 5 - Conducted Emission Measurements Faraday Cage Methods
iec 61967-6-2002-06
Technical Requirements and Measurement Methods for Diagnosis of Electromagnetic Emissions within Telecommunications Equipment (150kHz-1GHz) Part 6 - Conducted Emission Measurements Magnetic Field Probe Methods
“Reminder: swipe tables left and right” The above is a list of all test standards applicable to IC EMC testing in China, the relevant technical requirements not only for IC manufacturers to put forward higher technical requirements, in addition to the majority of electronic product manufacturers in the selection of IC chips can provide a reference to the IC manufacturers can be proposed to meet the requirements of the above standards for more stringent manufacturing requirements, in order to improve the quality of China's IC industry product quality Protecting and escorting.